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Fail-safes in nanotechnology : ウィキペディア英語版 | Fail-safes in nanotechnology
Fail-safes in nanotechnology are devices or features integrated with nanotechnology which, in the event of failure, respond in a way that will cause no harm, or at least a minimum of harm, to other devices or personnel. Fail-safe principles are governed by national standards and engineering practices, and are widely used in conventional engineering design. It is possible to scale down macro-scale fail-safe principles and devices for similar applications at the nano-scale.〔Whitesides, George M. and J Christopher Love. “The Art of Building Small.” Scientific American Reports Sep. 2007: 13-21.〕 The use of fail-safes in nanotechnology applications supports social acceptance of those applications by reducing the risks to users; , there are both theoretical and practical ways to implement fail-safe designs in nanotechnology. A predominant challenge to the social acceptance of nanotechnology is concerned with the medical use of nanostructures in the human body. While any structure for medical use would be developed to be bio-compatible and harmless, sound engineering design must take into account all possibilities of failure. Thus, the design would include ways to manipulate the structures in the body in the event of failure.
==Ferrous nanoparticles== Many researchers are looking into creating nano-scale robots (“nanobots”), for the purpose of undertaking tasks where only robots on the nano scale can be used, such as inside the human body. These robots would have the ability to construct other nanostructures or perform medical procedures, and will be introduced into the body via an injection.〔Šafařík, Ivo, and Mirka Šafaříková. “Magnetic Nanoparticles and Biosciences.” Chemical Monthly 133.6 (2002): 737-759.〕 The robots’ shells and circuits would be made of ferrous nanoparticles so that a magnetic field could be used to prevent or manipulate their movement. In case of failure or malfunction, a small EMP or an MRI could be used to deactivate the nanobots. Both techniques induce an electromagnetic field, corrupting the memory and shorting out the circuitry of any electronic device within range.
抄文引用元・出典: フリー百科事典『 ウィキペディア(Wikipedia)』 ■ウィキペディアで「Fail-safes in nanotechnology」の詳細全文を読む
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